Modification of AFM tips for facilitating picking-up of nanoparticles
Document Type
Article
Publication Date
7-1-2008
Abstract
The radius of atomic force microscope (AFM) tip is a key factor that influences nonspecific interactions between AFM tip and nanoparticles. Generally, a tip with larger radius contributes to a higher efficiency of picking up nanoparticles. We provide two methods for modifying the AFM tip: one is to wear a tip apex on a solid substrate and the other is to coat a tip with poly (dimethylsiloxane) (PDMS). Both the approaches can enhance the adhesion force between the tip and nanoparticles by increasing tip radius. The experimental results show that a modified tip, compared to an unmodified one, achieves six-fold efficiency improvement in the capture of targeted colloidal gold nanoparticles. © 2008 Chinese Physical Society and IOP Publishing Ltd.
Publication Source (Journal or Book title)
Chinese Physics Letters
First Page
2407
Last Page
2409
Recommended Citation
Wang, P., Yang, H., Wang, H., Li, H., Wang, X., Wang, Y., Lü, J., Li, B., Zhang, Y., & Hu, J. (2008). Modification of AFM tips for facilitating picking-up of nanoparticles. Chinese Physics Letters, 25 (7), 2407-2409. https://doi.org/10.1088/0256-307X/25/7/021