Low frequency acoustic response of surface cracks by atom force acoustic microscopy

Document Type

Article

Publication Date

6-1-2009

Abstract

Surface crack of CeF3 films generated by thermal stress were characterized by scanning electron microscopy and atom force acoustic microscopy (AFAM). Low frequency (818 kHz) acoustic response of films and cracks was measured by AFAM. The low frequency acoustic response is similar to what had been got at several MHz or even higher frequency. It was found that surface elastic properties of CeF3 films can be easily qualitatively measured by low frequency AFAM. © 2009 World Scientific Publishing Company.

Publication Source (Journal or Book title)

Surface Review and Letters

First Page

449

Last Page

453

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