Characterization and application of cerium fluoride film in infrared antireflection coating

Document Type

Article

Publication Date

9-1-2009

Abstract

Cerium fluoride (CeF3) thin films were evaporated to the germanium substrates at different substrate temperature from 100 °C to 250 °C. Structural and optical properties were characterized by X-ray diffraction (XRD), scan electron microscopy (SEM) and Fourier transform infrared spectroscopy (FTIR). The morphology of samples deposited at different temperature can be closely related to preferred orientation. The infrared optical constants were obtained by fitting the transmission spectrum using Lorentz oscillator model. A simple example for fabrication of long-wave infrared broadband antireflection coating was also presented. © 2009 Elsevier B.V. All rights reserved.

Publication Source (Journal or Book title)

Infrared Physics and Technology

First Page

204

Last Page

207

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