Electrical characteristics of SiGe-on-insulator nMOSFET and sige-silicon-on-aluminum nitride nMOSFET
Document Type
Article
Publication Date
12-1-2010
Abstract
This paper investigates the electrical characteristics and temperature distribution of strained Si/SiGe n-type metal oxide semiconductor field effect transistor (nMOSFET) fabricated on silicon-on-aluminum nitride (SOAN) substrate. This novel structure is named SGSOAN nMOSFET. A comparative study of self-heating effect of nMOSFET fabricated on SGOI and SGSOAN is presented. Numerical results show that this novel SGSOAN structure can greatly eliminate excessive self-heating in devices, which gives a more promising application for silicon on insulator to work at high temperatures. © 2010 Chinese Physical Society and IOP Publishing Ltd.
Publication Source (Journal or Book title)
Chinese Physics B
Recommended Citation
Liu, H., Li, B., Li, J., Yuan, B., & Hao, Y. (2010). Electrical characteristics of SiGe-on-insulator nMOSFET and sige-silicon-on-aluminum nitride nMOSFET. Chinese Physics B, 19 (12) https://doi.org/10.1088/1674-1056/19/12/127303