Study on the far-field intensity distribution of high-power semiconductor Bar and Stack lasers
Document Type
Article
Publication Date
4-1-2012
Abstract
In this paper, the bi-peak model is applied on both Bar and Stack lasers. By superposition of intensity for each emitter non-coherently, the far-field intensity models of Bar and Stack lasers are obtained. According to this model, the distributions of far-field intensity of Bar and Stack lasers are simulated. For Bar and Stack lasers, quantitative descriptions of both homogeneously-distributed regions and the position where the distribution is similar to bi-peak distribution formed by a single emitter are given. The corresponding experienced formulas are also presented. By employing these formulas and the parameters on the datasheet, the homogeneously-distributed regions and the position where the distribution is similar to the bi-peak distribution formed by a single emitter can be easily found. The results are expected to provide a theoretical foundation for the design of optical systems and the evaluation of the laser beam quality in the practical application.
Publication Source (Journal or Book title)
Guangdianzi Jiguang/Journal of Optoelectronics Laser
First Page
667
Last Page
675
Recommended Citation
Li, B., Zeng, X., Shang, J., & Huo, L. (2012). Study on the far-field intensity distribution of high-power semiconductor Bar and Stack lasers. Guangdianzi Jiguang/Journal of Optoelectronics Laser, 23 (4), 667-675. Retrieved from https://repository.lsu.edu/ag_exst_pubs/385