Large-signal characterization of AlGaAs/GaAs HBT's
Document Type
Article
Publication Date
12-1-1999
Abstract
A modified Ebers-Moll levels model is developed for AlGaAs/GaAs heterojunction bipolar transistors (HBT's). The self-heating effect is modeled by a thermal-electrical sub-circuit. The model is verified by comparing the large-signal RF simulation and measurement. Good agreement is achieved when the HBT is biased at low dc power dissipation. The discrepancy between simulation and measurement when the HBT is biased at high dc power dissipation is explained by considering the self-heating effect under large-signal RF excitation. © 1999 IEEE.
Publication Source (Journal or Book title)
IEEE Transactions on Microwave Theory and Techniques
First Page
1
Last Page
4
Recommended Citation
Li, B., Prasad, S., Yang, L., & Wang, S. (1999). Large-signal characterization of AlGaAs/GaAs HBT's. IEEE Transactions on Microwave Theory and Techniques, 47 (9 PART 1), 1-4. Retrieved from https://repository.lsu.edu/ag_exst_pubs/1097