Document Type
Patent
Patent Number
US 11488740B2
Abstract
A phase contrast X-ray imaging system includes: an illumination source adapted to illuminate a region of interest; a diffraction grating adapted to receive illumination from the illuminated region of interest, the diffraction grating comprising a spatial structure having a first periodicity superimposed with a second periodicity that is different from the first periodicity; and a detector adapted to detect illumination passing through the diffraction grating, wherein the spatial structure is defined by varying height and/or pitch, and wherein the spatial structure imparts a first phase dependence based on the first periodicity and an additional phase dependence based on the second periodicity on the illumination passing through the diffraction grating.
Application Number
US17/097,770
Assignees
Louisiana State University
Publication Date
11-1-2022
Recommended Citation
Dey, J., Bhusal, N., Butler, L., Dowling, J. P., Ham, K., & Singh, V. (2022). Phase Contrast X-ray Interferometry. Retrieved from https://repository.lsu.edu/science_patents/7