Experimental ultrafast spectroscopy used to study carrier dynamics of high quality silicon on glass sample

Authors

O. S. Magaña-Loaiza, Instituto Nacional de Astrofisica Optica y Electronica
R. Sobolewski, University of Rochester
J. J. Sánchez-Mondragón, Instituto Nacional de Astrofisica Optica y Electronica
C. Kosik-Williams, Corning Incorporated
J. Zhang, University of Rochester

Document Type

Conference Proceeding

Publication Date

1-1-2010

Abstract

We study, experimentally and theoretically, the carrier dynamics in high quality silicon on glass sample by a model that relates the reflectance time dependence with the carrier dynamics. © 2010 Optical Society of America.

Publication Source (Journal or Book title)

Optics InfoBase Conference Papers

Recommended Citation

Magaña-Loaiza, O., Sobolewski, R., Sánchez-Mondragón, J., Kosik-Williams, C., & Zhang, J. (2010). Experimental ultrafast spectroscopy used to study carrier dynamics of high quality silicon on glass sample. Optics InfoBase Conference Papers https://doi.org/10.1364/laop.2010.we21