Angle resolved photoemission from ultrathin films of Cu/Ni(001)
Document Type
Conference Proceeding
Publication Date
1-1-1996
Abstract
We present a study of the quantum well states observed in Cu/Ni(001). Several reports in the recent past have shown that these states, which are derived from the bulk, disperse through the Fermi level at a thickness of about 6 ML. Using angle-resolved photoemission, we have imaged the photoelectron angular distributions from several thicknesses of Cu/Ni(001). We observe that these states have s,p like symmetry and are located near the zone edge.
Publication Source (Journal or Book title)
Materials Research Society Symposium - Proceedings
First Page
59
Last Page
63
Recommended Citation
Subramanian, K., Mankey, G., Stockbauer, R., & Kurtz, R. (1996). Angle resolved photoemission from ultrathin films of Cu/Ni(001). Materials Research Society Symposium - Proceedings, 427, 59-63. https://doi.org/10.1557/proc-427-59