Document Type

Article

Publication Date

1-1-2000

Abstract

Electron tunneling measurements of the density of states (DOS) in ultrathin Be films reveal that a correlation gap mediates their insulating behavior. In films with sheet resistance Rln(V) Efros-Shklovskii Coulomb gap spectrum finally emerges in the highest R films. Transport measurements of films which display this gap are well described by a universal variable range hopping law R(T) = (h/2e2)exp(T0/T)1/2. © 2000 The American Physical Society.

Publication Source (Journal or Book title)

Physical Review Letters

First Page

1543

Last Page

1546

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