Title
Critical Coupling of Visible Light Extends Hot-Electron Lifetimes for HO Synthesis
Document Type
Article
Publication Date
5-20-2020
Abstract
Devices driven by above-equilibrium "hot" electrons are appealing for photocatalytic technologies, such as in situ HO synthesis, but currently suffer from low (<1%) overall quantum efficiencies. Gold nanostructures excited by visible light generate hot electrons that can inject into a neighboring semiconductor to drive electrochemical reactions. Here, we designed and studied a metal-insulator-metal (MIM) structure of Au nanoparticles on a ZnO/TiO/Al film stack, deposited through room-temperature, lithography-free methods. Light absorption, electron injection efficiency, and photocatalytic yield in this device are superior in comparison to the same stack without Al. Our device absorbs >60% of light at the Au localized surface plasmon resonance (LSPR) peak near 530 nm-a 5-fold enhancement in Au absorption due to critical coupling to an Al film. Furthermore, we show through ultrafast pump-probe spectroscopy that the Al-coupled samples exhibit a nearly 5-fold improvement in hot-electron injection efficiency as compared to a non-Al device, with the hot-electron lifetimes extending to >2 ps in devices photoexcited with fluence of 0.1 mJ cm. The use of an Al film also enhances the photocatalytic yield of HO more than 3-fold in a visible-light-driven reactor. Altogether, we show that the critical coupling of Al films to Au nanoparticles is a low-cost, lithography-free method for improving visible-light capture, extending hot-carrier lifetimes, and ultimately increasing the rate of in situ HO generation.
Publication Source (Journal or Book title)
ACS applied materials & interfaces
First Page
22778
Last Page
22788
Recommended Citation
Willis, D. E., Taheri, M. M., Kizilkaya, O., Leite, T. R., Zhang, L., Ofoegbuna, T., Ding, K., Dorman, J. A., Baxter, J. B., & McPeak, K. M. (2020). Critical Coupling of Visible Light Extends Hot-Electron Lifetimes for HO Synthesis. ACS applied materials & interfaces, 12 (20), 22778-22788. https://doi.org/10.1021/acsami.0c00825