Crystal structure, surface morphology, depth profile of elements and mid-infrared optical constants of Te-rich lead telluride films

Document Type

Article

Publication Date

2-1-2005

Abstract

The characterization of Te-rich PbTe layer thermal-evaporated from an excess of Te (< 1 mol.%) evaporable materials was reported. The results reveal that the films obtained are polycrystalline and have single-phase NaCl-type PbTe crystal structure. It is also demonstrated that the films have homogeneous surface morphology and homogeneous distribution of Te-rich components along the layer in the range of 170 nm. The study on mid-infrared optical constants of film surface-polished indicates that the influence of surface scattering on optical properties is very small.

Publication Source (Journal or Book title)

Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

First Page

23

Last Page

26

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