Capturing and depositing one nanoobject at a time: Single particle dip-pen nanolithography

Authors

Ying Wang, Shanghai Institute of Applied Physics, Chinese Academy of Sciences
Yi Zhang, Shanghai Institute of Applied Physics, Chinese Academy of Sciences
Bin Li, Shanghai Institute of Applied Physics, Chinese Academy of Sciences
Junhong Lü, Shanghai Institute of Applied Physics, Chinese Academy of Sciences
Jun Hu, Shanghai Institute of Applied Physics, Chinese Academy of Sciences

Document Type

Article

Publication Date

4-8-2007

Abstract

A convenient technique for transferring nanoparticles in a one-particle-at-a-time fashion is presented. This technique, termed as single particle dip-pen nanolithography, employs an atomic force microscope (AFM) tip to "grab" individual gold nanoparticles on surfaces. The nanoparticles attached to the AFM tips can be then controllably released and redeposited site specifically on surfaces. Patterns composed of single gold particles have been fabricated. © 2007 American Institute of Physics.

Publication Source (Journal or Book title)

Applied Physics Letters

Recommended Citation

Wang, Y., Zhang, Y., Li, B., Lü, J., & Hu, J. (2007). Capturing and depositing one nanoobject at a time: Single particle dip-pen nanolithography. Applied Physics Letters, 90 (13) https://doi.org/10.1063/1.2714287