Planning Accelerated Life Tests with Type II Censored Data

Document Type

Article

Publication Date

1-2-1986

Abstract

This paper presents methods for planning accelerated life tests for models in which the logarithm (or some other appropriate transformation) of time-to-failure follows a location-scale distribution and the location parameter is a function of stress. We give exact expressions for the BLUE of the 100Pth percentile of the life distribution at design conditions and for the variance of this estimator. Then we describe methods for evaluating the important properties of test plans and for finding approximate continuous and exact discrete optimum test plans. A numerical example illustrates the methods. © 1986, Taylor & Francis Group, LLC. All rights reserved.

Publication Source (Journal or Book title)

Journal of Statistical Computation and Simulation

First Page

273

Last Page

297

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