Pitfalls of accelerated testing
Document Type
Article
Publication Date
12-1-1998
Abstract
Accelerated tests are used to obtain timely information on product-life or performance-degradation over time. Test units are used more frequently than usual or are subjected to higher than usual levels of accelerating variables like temperature & voltage. Then the results arc used, through an appropriate physically-based statistical model, to make predictions about product life or performance over time, at the more moderate use-conditions. The extrapolative predictions inherent in the use of accelerated testing raise serious concerns, and the use of accelerated testing has many dangerous pitfalls. This paper warns potential users about some of these pitfalls. © 1998 John Wiley & Sons, Inc.
Publication Source (Journal or Book title)
IEEE Transactions on Reliability
First Page
114
Last Page
118
Recommended Citation
Meeker, W., & Escobar, L. (1998). Pitfalls of accelerated testing. IEEE Transactions on Reliability, 47 (2), 114-118. https://doi.org/10.1109/24.722271