Accelerated Life Tests: Concepts and Data Analysis

Document Type

Article

Publication Date

1-1-1999

Abstract

Today's manufacturers face strong pressure to develop new, higher technology products in record time, while improving productivity, product field reliability, and overall quality. Estimating the failure-time distribution or long-term performance of high-reliability products is particularly difficult. Most modern products are designed to operate without failure for years, decades, or longer. Thus few units will fail or degrade appreciably in a test of practical length at normal use conditions. Thus the requirements for rapid product development and higher reliability have increased the need for accelerated testing of materials, components, and systems. This paper describes methods for analyzing and planning accelerated life tests with an application in the area of microelectronics. In this application, the purpose of the accelerated life test was to study the dominant failure mechanism of an integrated circuit. It was believed that a first-order chemical reaction would provide an adequate description of this failure mechanism. Similar methods can be used to do laboratory evaluations of the life of products like paints and coatings. We have also included a section describing methods for using laboratory tests to predict life in the field with variability in use rates as well a both spatial and temporal variability in environmental conditions.

Publication Source (Journal or Book title)

ACS Symposium Series

First Page

149

Last Page

169

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