Microstructure and optical properties of Pb1-xGexTe films

Document Type

Article

Publication Date

1-1-2002

Abstract

Pb1-xGexTe thin films and Pb1-xGexTe/ZnSe (x = 0.08) multilayer coatings were prepared on Si substrates and Ge substrates with a thermal evaporation technique. Crystallographic analysis showed that the films are polycrystalline, and transmission electron microscope (TEM) observation revealed that the Pb1-xGexTe/ZnSe multilayer coating has a dense and homogeneous structure. The refractive indices of the thin films were measured in the spectral range of 6.5-25 μm, over the temperature range of 85-300 K. The temperature coefficient, dn/dT, was found to be dependent on the wavelength and substrate temperature. For the film deposited on Ge substrates at 180°C, the value of dn/dT at 10 μm is 0 K-1 over the temperature range of 85-300 K. A 10.8 μm band-pass filter made of Pb1-xGexTe/ZnSe was fabricated, and a very slight spectral shift of the band-pass edge was found to occur with decreasing temperature.

Publication Source (Journal or Book title)

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

First Page

4594

Last Page

4596

This document is currently not available here.

Share

COinS