Anomalies in refractive index of Pb1-xGexTe thin film corresponding to ferroelectric phase transition

Document Type

Article

Publication Date

10-1-2002

Abstract

The refractive index n of Pb1-xGexTe (x=0.06) thin film is determined from transmission spectra measured at temperature 80 K-300 K by fitting based on a Lorentz-oscillator model. It is found that a maximum of refractive index occurs at 150 K, which is the structure phase transition temperature Tc. This maximum is identified with occurrence of abnormal permittivity that is an indication of the ferroelectric nature of the phase transition. Therefore, it can be concluded that anomalies in the refractive index, similar to those in the electrical resistivity and specific heat, occur at the phase transition from rocksalt to rhombohedrally distorted structure. The empirical relations, such as Moss relation, are not suitable to the refractive index, band gap in the range of spectrum and temperature.

Publication Source (Journal or Book title)

Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors

First Page

1062

Last Page

1066

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