Crystal structure, morphology, depth profile of elements and mid-infrared optical constants of 'mild' lead telluride film
Document Type
Conference Proceeding
Publication Date
4-1-2003
Abstract
The characterizations of a so-called 'mild' PbTe layer thermal-evaporated from an excess of Te (< 1 mol.%) evaporable materials are reported. The results reveal that the film obtained is polycrystalline and has a single-phase NaCl-type PbTe crystal structure. It is also demonstrated that the film has a homogeneous surface morphology and a high degree of homogeneous distribution of Te-rich components along the layer. The study of mid-infrared optical constants of a surface-polished film indicates that the influence of surface scattering on optical properties is very small.
Publication Source (Journal or Book title)
Applied Physics A: Materials Science and Processing
First Page
965
Last Page
968
Recommended Citation
Li, B., Zhang, S., Zhang, F., & Zeng, L. (2003). Crystal structure, morphology, depth profile of elements and mid-infrared optical constants of 'mild' lead telluride film. Applied Physics A: Materials Science and Processing, 76 (6), 965-968. https://doi.org/10.1007/s00339-002-1948-9