Decay of Hf172 to levels in Lu172
The electron-capture decay of Hf172 was investigated. Single and coincidence measurements were made by using germanium x-ray detectors. In addition, a Si(Li) detector was used to study the low-energy portion, A 60 keV, of the γ-ray spectrum. These results were then combined with available conversion-electron data which had been obtained with a magnetic spectrometer. From this information, a decay scheme for Hf172 was constructed. It incorporates 17 transitions into 11 excited levels in Lu172 and differs from previously proposed decay schemes. Several transitions previously attributed to Hf172 decay were not observed in the present study. The electron-capture decay energy was deduced from measured K x-ray intensities and the level scheme to be 350±50 keV. RADIOACTIVITY Hf172, measured Eγ, Iγ, Ix, γγ coin; deduced QEC. Lu172 deduced levels Jπ. © 1979 The American Physical Society.
Publication Source (Journal or Book title)
Physical Review C
Toth, K., Ellis, Y., Sousa, D., Carter, H., Sen, D., & Zganjar, E. (1979). Decay of Hf172 to levels in Lu172. Physical Review C, 20 (5), 1902-1907. https://doi.org/10.1103/PhysRevC.20.1902