Ultrafast optics used to study carrier dynamics of high quality silicon on glass sample
We present experimental and theoretical studies that regards in the formulation of a reflectance model that allows relating it with carrier dynamics in high quality silicon on glass sample as well as optical parameters. © 2010 Optical Society of America.
Publication Source (Journal or Book title)
Optics InfoBase Conference Papers
Magaña-Loaiza, O., Sobolewski, R., Sanchez Mondragon, J., Kosik-Williams, C., & Zhang, J. (2010). Ultrafast optics used to study carrier dynamics of high quality silicon on glass sample. Optics InfoBase Conference Papers Retrieved from https://repository.lsu.edu/physics_astronomy_pubs/3041