Micron level placement of nanowires via real time observation under optical microscope on a desired nanochannel for nanosensors application
Document Type
Conference Proceeding
Publication Date
1-1-2016
Abstract
Alignment and placement of a single nanowire is a crucial task to assemble lab-on-a-chip devices. Nanowires placement techniques have been mostly performed by pick and place techniques or flow control techniques. These techniques require expensive control systems and they cannot be performed in the ambient conditions. This paper introduces a vision-based inexpensive approach for the alignment and placement of individual metal nanowires on a target nanochannel. Through visual observation of the optical microscope, the method aligned the nanowire perpendicular to the nanochannel. The reproducibility of the procedures was experimentally evaluated.
Publication Source (Journal or Book title)
ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)
Recommended Citation
Beheshti, M., Park, S., Choi, J., Geng, X., & Podlaha-Murphy, E. (2016). Micron level placement of nanowires via real time observation under optical microscope on a desired nanochannel for nanosensors application. ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE), 10 https://doi.org/10.1115/IMECE201667969